HIERARCHICAL SCAN AND ATPG FOR TWO STAGE WRAPPER

Hierarchical Scan and Atpg for Two Stage Wrapper

There are multiple scenarios where at-speed coverage over core boundaries is difficult. The idea is to resolve this problem using two stage wrapper. Generally single stage wrapper is used in the present design techniques, and is used in industries. Here two stage wrapper is used in which test coverage has been increased. Additional scan compression architecture is introduced to reduce the patte...

Tessent®: Scan and ATPG

ATPG for scan chain latches and flip-flops

A new approach for testing the bistable elements (latches and flip-flops) in scan chain circuits is presented. In this approach, we generate test patterns that apply a checking experiment to each bistable element in the circuit while checking their response. Such tests guarantee the detection of all detectable combinational defects inside the bistable elements. The algorithm is implemented by m...

An ATPG Enhancement for Reducing Scan-Based Test Application Time

We propose a new test application method that can be applied on top of any combinational stuck-at fault ATPG to significantly reduce the test application time in full scan designs. In contrast to any other existing method, our approach effectively utilizes both the shift and reapply basic scan operations. The computational difficulties that arise due to the enormous search space are tackled by ...

Active Learning for Hierarchical Wrapper Induction

Information mediators that allow users to integrate data from several Web sources rely on wrappers that extract the relevant data from the Web documents. Wrappers turn collections of Web pages into database-like tables by applying a set of extraction rules to each individual document. Even though the extraction rules can be written by humans, this is undesirable because the process is tedious, ...